BIRC Workshops and Seminars
List of recent BIRC-organized workshops and seminars:
April 2025: Co-localization analysis workshop (4 hours)
• Guest lecturer – Pablo Ariel, UNC Chapel Hill
• Additional speaker – Alison North, RU BIRC
• Facilitators – RU BIRC staff
• Capped at 35 attendees
March 2024: SVI/Huygens workshop
• 1-day workshop for Rockefeller University and other local attendees on practical use of Huygens software, including introduction to the new Quality Control module
• Presenters – Vincent Schoonderwoert and Nicolaas van der Woort (Netherlands)
• Approx. 40 attendees
November 2022: “PAIR-UP” advanced microscopy workshop
• 2nd advanced microscopy workshop, hosted by the RU BIRC as part of the PAIR-UP initiative organized by George Langford, Syracuse University
• External faculty also included Joerg Bewersdorf, Yale University and Ian Dobbie, Johns Hopkins University
• Focused on the topic of super-resolution microscopy: method and equipment demonstrations included Facility Line STED (Abberior), OMX 3D-SIM, Airyscan confocal (Zeiss 980) and PanExpansion microscopy/confocal. Demos performed by RU BIRC staff and visiting faculty and their colleagues
• 21 imaging scientists from across the USA attended
May 2022: OMERO and Data Management seminar and community discussion
• Speaker – Jason Swedlow, OBE, Dundee University, UK
• Kick-off event for establishing interest in the RU and local NYC community for using OMERO as a database for managing microscopy data, with seminar followed by a 2-hour discussion with attendees and members of the GLENCOE software team for supporting OMERO
January 2020: Imaris workshop
• 1-day workshop on image processing using Imaris software (Bitplane/Andor/Oxford Instruments)
• Capped at 45 attendees (RU and local NYC institutions)
October 2019: Zeiss Zen Blue workshop
• 1-day workshop organized by local representatives from Carl Zeiss Inc., together with Alison North and staff of the BIRC, for RU and other NYC attendees
April 2019: Second meeting of the North Atlantic Microscopy Society (NAMS)
• Alison North (RU) and Darcy Peterka (Columbia University), local organizers
July 2018: Introduction to image analysis and FIJI
• 2-day workshop, taught by Teng-Leong Chew, Director of the Advanced Imaging Center (AIC) at Janelia Research Campus, assisted by the staff of the RU BIRC
• Capped at 50 attendees
April 2017: STED MiniSymposium
• Speakers: Joerg Bewersdorf, Yale University, Christian Eggeling, Oxford University (UK) and Christian Wurm, Abberior Instruments (Germany)
• Organized and hosted by Alison North and the RU BIRC
• Symposium followed by a multi-day demonstration of the Abberior Expert Line STED system
• Attendees from all across the eastern USA